The On-Wafer Microwave Measurements and De-embedding Book
Dear RF and Microwave Measurements fellows,
I’m proud to announce my upcoming “On-Wafer Microwave Measurements and De-embedding” book, to be released by Artech House. 
This book is a result of the gathered experience from several years of work in academia and industry. This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.
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