RF Microwave Measurements – Impressions
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My trip to the San Francisco Bay Area is coming to an end and it is time to summarize the impressions so far. Attending the International Symposium on Quality Electronic Design (ISQED) was an overall nice experience and allowed me to reach out to other scientists active in the RF Microwave semiconductor business.
My contribution to this year’s event is entitled ‘RF Passive Device Modeling and Characterization in 65nm CMOS Technology’ and deals with the design and characterization of CMOS silicon integrated passives. The associated RF Microwave Measurements were an essential part of this publication.
Take a look at the Publications page of this blog for more details…
I also had the opportunity to visit the Stanford campus and take a tour at the facilities of the Electrical Engineering department. I must say that the campus itself is pretty impressive and provides the proper environment needed for high quality research.
This academic endeavor concluded with a visit to the equally impressive Berkeley campus and the Berkeley Wireless Research Center (BWRC), where I had the opportunity to spend some quality time with its researchers. Taking a tour at their microwave measurements laboratories was a nice experience and rounded up in the best possible way this week in the San Francisco Bay Area.
