On-Wafer Microwave Measurements and De-embedding
Get 30% Discount for your On-Wafer Microwave Measurements and De-embedding book.
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advanced CMOS technologies.
Use Promo Code LOU30 and get your copy with a 30% discount and free shipping! Offer expires 7/31/2016.
