Microwave Paper
Here we go again, this is yet another Microwave Paper from the RF and Microwave Measurements blog!
Microwave paper
This latest publication is entitled “CMOS 65nm “on chip” broadband real time substrate noise measurement” and appeared in IET Electronics Letters, in Oct. 2015. In this paper the focus is on substrate noise coupling detection and measurements. This paper resulted from a collaboration of Helic, Inc. and the University of Thessaloniki, Greece. My contribution was the on-wafer silicon chip characterization and signal evaluation via proper instrumentation (Spectrum Analyzer and Oscilloscope).
As with all microwave publications on this blog, you can download the paper and look through the material. I’m looking forward to receiving your comments on that. I strongly believe in the knowledge exchange process that is needed in order to succeed in science.
Stay tuned at this blog for more news and updates of RF and Microwave Measurements!
