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CMOS mm-Wave Transmission Lines – That hard?

CMOS mm-Wave Transmission Lines

Sure, there are a lot of texts out there about the theoretical principles of transmission line design and we won’t repeat them here.

We all know that a transmission line is a two-wire system with a signal and return path and is described in terms of its distributed inductance L’ (H/m), capacitance C’ (F/m), resistance R’ (/m), and conductance G’ (S/m). The complex propagation constant γ = α + jβ, where α is the attenuation constant and β is the phase constant, is used for describing the AC signal propagation. In its general form the complex propagation constant is given by γ =sqrt((R’ + jωL’)(G’ + jωC’)).

But how do you actually design a transmission line to exhibit specific electrical parameters, e.g. characteristic impedance Z~sqrt(L’/C’) and a specific phase constant β~sqrt(L’C’). Well, if you look simply at the formulation you may say… it’s not that hard, design a transmission line with a specific per length inductance L’ and capacitance C’ that fits your specification.


Example of designed 50Ω CMOS Coplanar Waveguide Transmission Line

Absolutely, you’re right, in principle it really all comes down to the per length metrics. The cumbersome part is to understand the transmission line physics and how a certain geometry affects them. E.g. does a microstrip or coplanar waveguide transmission line have similar current return paths?

Take a look at a typical cross section and judge by yourself… a) Microstrip and b) Coplanar Waveguide


Why is a CMOS design that challenging?

Take a look at the simplified cross sections, from left to right, 65nm, 40nm and 28nm CMOS process cross-sections.

Challenge in CMOS design lies with several limitations and constraints that arise from the technology itself. Transmission lines on CMOS are typically fabricated using the upper metals of the back end of line (BEOL) due to their superior conductivity. The BEOL process imposes hard constraints on the size and physical position of those metals, with each layer having specific thickness, conductivity, and height from the silicon substrate. BEOL metals are embedded in silicon oxide dielectrics with relative permittivities typically ranging from 3 to 8. In addition to that, certain design rules limit the minimum and maximum width and minimum spacing of the metal layers, as well as metal density.

As a topping, take this stack-up and embed it in a total of ~ 40 dielectrics 🙂

Wait, no reason to be desperate… this is why I wrote my IEEE MTT Transactions paper entitled Parametric Analysis and Design Guidelines for mm-Wave Transmission Lines in nm CMOS.

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On-Wafer Microwave Measurements book is out there!

This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advanced CMOS technologies.

Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.


Reviews

“Dr. Lourandakis demystifies the art of on-wafer measurements by offering a solid theoretical foundation along with a wealth of practical guidelines to help researchers and lab professionals characterize silicon devices for numerous high-speed applications ranging from 5G RFICs, to automotive radars, to multi-Gbps SoCs.”
Dr. Yorgos Koutsoyannopoulos, CEO Helic, Inc.

“This book provides an excellent narrative for those engineers wishing to understand on-wafer calibration techniques from the absolute basics up to an advanced level. The early chapters build up from the operation of the vector network analyser and the basics of calibration steadily advancing to on-wafer calibration algorithms such as TRL and LRM and de-embedding routines. Finally their application in DUT measurements for active and passives on silicon are covered but much of this transposes to other substrates including GaAs. This is certainly a book I would recommend to my students as a primer for on-wafer device measurement and as a prelude to parameter extraction and device modelling.”
Dr. Robin Sloan, Professor of Millimetre-wave Electronics, University of Manchester

On-Wafer Microwave Measurements and De-embedding offers its readers a complete understanding of on-wafer vectorial network analyzer measurement techniques. Errikos Lourandakis presents a clear, precise, and elegant document to master all the techniques related to on-wafer vectorial network measurements. The author is testifying a great pedagogy by numerous concrete examples making this book an important supplement in educating RF and microwave engineers. Any engineer desiring to work with a microwave/ RF probe station should own this book.”
Dr. Tibault Reveyrand, Research Associate and Lecturer at University of Colorado, Boulder

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On-Wafer Microwave Measurements and De-embedding Book Discount

On-Wafer Microwave Measurements and De-embedding

Get 30% Discount for your On-Wafer Microwave Measurements and De-embedding book.

OnWafer_Microwave_Measurements_Cover

 

This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advanced CMOS technologies.

 

Use Promo Code LOU30 and get your copy with a 30% discount and free shipping! Offer expires 7/31/2016.

 

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On-Wafer Microwave Measurements and De-embedding

The On-Wafer Microwave Measurements and De-embedding Book

Dear RF and Microwave Measurements fellows,

I’m proud to announce my upcoming “On-Wafer Microwave Measurements and De-embedding” book, to be released by Artech House. On-Wafer Microwave Measurements and De-embedding

This book is a result of the gathered experience from several years of work in academia and industry. This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.

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CDNLive May 2-4, in Munich, Germany

RF and Microwave Measurements News

Hello dear RF and Microwave Measurements folks,

I have some interesting news to share with you. This year I’m attending the CDNLive event May 2-4, in Munich, Germany and would be thrilled to meet you over there.

CDNLive brings together Cadence® technology users, developers, and industry experts to network, share best practices on critical design and verification issues, and discover new techniques for realizing advanced silicon, SoCs, and systems.

 

My talk is entitled “nm CMOS Device Synthesis for mm-Wave Design” and is scheduled for session CUS05 on Monday May 2, 2016.

Get your ticket and let’s meet at the CDNLive event for some exchange on RF Microwave Measurements and CMOS Technology!

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Microwave Paper – Substrate Noise Coupling

Microwave Paper

Here we go again, this is yet another Microwave Paper from the RF and Microwave Measurements blog!

Microwave paper

Microwave paper

This latest publication is entitled “CMOS 65nm “on chip” broadband real time substrate noise measurement” and appeared in IET Electronics Letters, in Oct. 2015. In this paper the focus is on substrate noise coupling detection and measurements. This paper resulted from a collaboration of Helic, Inc. and the University of Thessaloniki, Greece. My contribution was the on-wafer silicon chip characterization and signal evaluation via proper instrumentation (Spectrum Analyzer and Oscilloscope).

As with all microwave publications on this blog, you can download the paper and look through the material. I’m looking forward to receiving your comments on that. I strongly believe in the knowledge exchange process that is needed in order to succeed in science.

Stay tuned at this blog for more news and updates of RF and Microwave Measurements!

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RF Microwave Measurements Coaching

RF Microwave Measurements Coaching?

Are you seeking for some RF Microwave Measurements Coaching or a second look on your projects? No matter if you are interested in RF Microwave Measurements or not, you may be open to this idea.

Here are some exciting coaching news to share with you…

Coaching RF Microwave MeasurementsRecently I joined the 100mentors initiative acting as a mentor for the semiconductor/hardware sector. You may get in touch with me through my profile. The ambition here is to reach to people who are looking for coaching advice or a second opinion on their business and academic projects. Claiming to be an educator and knowledge seeker it is my duty to interact with motivated individuals out there.

Here are some impressions from the coaching event in Athens…

100mentors is an online platform trying to bridge the gap between well skilled active professionals and individuals trying to create or develop their own career path. In this context, I’m looking forward hearing from you soon!

To our success,

Errikos

 

 

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European Microwave Week 2014

European Microwave Week

Hello to all the RF folks out there, I’m pleased to announce that I will be at this year’s European Microwave Week in Rome. Still excited every time I have the opportunity to take part at such events.

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European Microwave Week 2014

My contribution to the conference is a paper entitled “Integrated RF transformer and power combiner design in 150nm CMOS process”.

It will be presented on Monday Oct. 6th 2014 in the EuMIC Session-01. I’m looking forward seeing you in Rome for some interaction on RF Microwave related topics.

Want to know more about it…. well, here is the abstract of the paper:

An integrated passive power combiner is discussed and characterized based on test structure fabricated in a 150 nm LFoundry CMOS process. The power combiner uses differentially driven coupled transformers as a basic building block. We discuss first the constraint driven synthesis of the transformer itself and the device modeling with a rapid RLCk model extractor. Helic’s electronic design automation (EDA) tools are used for both, synthesis and extraction of the passive devices. The accuracy of the extracted transformer model is proven by comparison to an EM tool. The fabricated power combiner structure is finally extracted with the same EDA toolset and compared to measured data from on-wafer experiments. Good agreement is achieved in all cases proving the accuracy of the proposed synthesis and extraction methodology for complex RF IC designs.

Drop me a line here at my blog at let’s meet and interact at the European Microwave Week!

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